F² FabFlow
Industrial AI for Manufacturing Analytics — Enterprise power with consumer ease.
F² FabFlow transforms complex semiconductor manufacturing data into actionable insights. Build and own your analytics pipeline without data engineers or ML experts.
Choose Your Path
📈 End Users
Manufacturing analysts and process engineers who want to analyze data and get insights.
Key Capabilities
| Capability | Description |
|---|---|
| Data Exploration | Interactive dashboards, process visualization, spatial wafer analysis |
| Defect Analysis | VLM-powered defect detection, root cause insights, operating envelope |
| Comprehensive Reports | LLM-powered insights, PDF export, executive summaries |
| Predictive Analytics | Quality prediction with SHAP explainability, what-if analysis |
| Anomaly Detection | Isolation Forest outlier detection, drift monitoring |
| AI Assistant | Jarvis AI for natural language data queries |
| AutoML | Hyperparameter tuning, experiment tracking, model comparison |
| Self-Service Ingestion | CSV/Parquet upload, S3 watcher, automatic column detection |
Quick Links
- Upload Your First Dataset — Get data into the platform
- Ask Jarvis for Insights — AI-powered analysis
- API Reference — Complete REST API documentation
- Troubleshooting — Common issues and solutions
Platform Overview
The dashboard provides real-time KPIs, production metrics, and system health at a glance.
What's New
See the Changelog for the latest updates.
Latest Release
v0.9.7 — Run clustering with anomaly detection, interactive scatter plots (PCA/t-SNE), and drill-down analysis for quality patterns.